Chen-Yu Wang1,?, Shi-Jun Liang1,?, Shuang Wang1, Pengfei Wang1, Zhu'an Li1, Zhongrui Wang2, Anyuan Gao1, Chen Pan1, Chuan Liu3, Jian Liu3, Huafeng Yang3, Xiaowei Liu1, Wenhao Song2, Cong Wang1, Bin Cheng1, Xiaomu Wang3, Kunji Chen3, Zhenlin Wang1, Kenji Watanabe4, Takashi Taniguchi4, J. Joshua Yang2,* and Feng Miao1,*
南京大學(xué)繆峰教授，美國(guó)馬薩諸塞大學(xué)楊建華教授
1 National Laboratory of Solid State Microstructures, School of Physics, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China.
2 Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA.
3 School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, China.
4 National Institute for Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan.
? These authors contributed equally to this work.
